http://arxiv.org/abs/2005.14067
This article presents an analysis and the resulting limits on light dark matter inelastically scattering off of electrons, and on dark photon and axion-like particle absorption, using a second-generation SuperCDMS high-voltage eV-resolution detector. The 0.93 gram Si detector achieved a 3 eV phonon energy resolution; for a detector bias of 100 V, this corresponds to a charge resolution of 3% of a single electron-hole pair. The energy spectrum is reported from a blind analysis with 1.2 gram-days of exposure acquired in an above-ground laboratory. With charge carrier trapping and impact ionization effects incorporated into the dark matter signal models, the dark matter-electron cross section $\bar{\sigma}{e}$ is constrained for dark matter masses from 0.5–$10^{4} $MeV$/c^{2}$; in the mass range from 1.2–50 eV$/c^{2}$ the dark photon kinetic mixing parameter $\varepsilon$ and the axioelectric coupling constant $g{ae}$ are constrained. The minimum 90% confidence-level upper limits within the above mentioned mass ranges are $\bar{\sigma}{e}\,=\,8.7\times10^{-34}$ cm$^{2}$, $\varepsilon\,=\,3.3\times10^{-14}$, and $g{ae}\,=\,1.0\times10^{-9}$.
S. Collaboration, D. Amaral, T. Aralis, et. al.
Fri, 29 May 20
18/75
Comments: 5 pages + title and references, 3 figures and 1 table