http://arxiv.org/abs/1811.03577
We present a metric to quantify systematic labeling bias in galaxy morphology data sets stemming from the quality of the labeled data. This labeling bias is independent from labeling errors and requires knowledge about the intrinsic properties of the data with respect to the observed properties. We conduct a relative comparison of label bias for different low redshift galaxy morphology data sets. We show our metric is able to recover previous de-biasing procedures based on redshift as biasing parameter. By using the image resolution instead, we find biases that have not been addressed. We find that the morphologies based on supervised machine-learning trained over features such as colors, shape, and concentration show significantly less bias than morphologies based on expert or citizen-science classifiers. This result holds even when there is underlying bias present in the training sets used in the supervised machine learning process. We use catalog simulations to validate our bias metric, and show how to bin the multidimensional intrinsic and observed galaxy properties used in the bias quantification. Our approach is designed to work on any other labeled multidimensional data sets and the code is publicly available.
G. Cabrera-Vives, C. Miller and J. Schneider
Fri, 9 Nov 18
50/64
Comments: N/A