http://arxiv.org/abs/1810.05610
We present a statistical analysis of properties of the Soft X-Ray (SXR) emission, plasma temperature (T), and emission measure (EM), derived from GOES observations of flares in 2002-2017. The temperature and emission measures are obtained using the TEBBS algorithm (Ryan et al. 2012), which delivers reliable results together with uncertainties even for weak B-class flare events. More than 96% of flares demonstrate a sequential appearance of T, SXR, and EM peaks, in agreement with the expected behavior of the chromospheric evaporation process. The relative number of such flares increases with increasing the SXR peak flux. The SXR peak is closer in time to the T peak for B-class flares than for >=C-class flares, while it is very close to the EM peak for MX-class flares. We define flares as “T-controlled events” if the SXR-T time delay is at least two times shorter than the EM-SXR delay, and as “EM-controlled events” if the EM-SXR delay is at least two times shorter than the SXR-T delay. For any considered flare class range, the T-controlled events compared to EM-controlled events have: a) higher EM but lower T; b) longer durations and shorter relative growth times; c) longer FWHM and characteristic decay times. Interpretation of these statistical results based on a dynamic loop model suggests that for flares of the same class range, the T-controlled events are developed in longer loops than the EM-controlled events.
V. Sadykov, A. Kosovichev, I. Kitiashvili, et. al.
Mon, 15 Oct 18
30/56
Comments: Submitted to The Astrophysical Journal (22 pages, 5 figures, 1 table)
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