http://arxiv.org/abs/2012.09084
We present end-to-end simulations of SCALES, the third generation thermal-infrared diffraction limited imager and low/med-resolution integral field spectrograph (IFS) being designed for Keck. The 2-5 micron sensitivity of SCALES enables detection and characterization of a wide variety of exoplanets, including exoplanets detected through long-baseline astrometry, radial-velocity planets on wide orbits, accreting protoplanets in nearby star-forming regions, and reflected-light planets around the nearest stars. The simulation goal is to generate high-fidelity mock data to assess the scientific capabilities of the SCALES instrument at current and future design stages. The simulation processes arbitrary-resolution input intensity fields with a proposed observation pattern into an entire mock dataset of raw detector read-out lenslet-based IFS frames with calibrations and metadata, which are then reduced by the IFS data reduction pipeline to be analyzed by the user.
Z. Briesemeister, S. Sallum, A. Skemer, et. al.
Thu, 17 Dec 20
46/85
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