http://arxiv.org/abs/1708.04625
Galaxy metallicity scaling relations provide a powerful tool for understanding galaxy evolution, but obtaining unbiased global galaxy gas-phase oxygen abundances requires proper treatment of the various line-emitting sources within spectroscopic apertures. We present a model framework that treats galaxies as ensembles of HII and diffuse ionized gas (DIG) regions of varying metallicities. These models are based upon empirical relations between line ratios and electron temperature for HII regions, and DIG strong-line ratio relations from SDSS-IV MaNGA IFU data. Flux-weighting effects and DIG contamination can significantly affect properties inferred from global galaxy spectra, biasing metallicity estimates by more than 0.3 dex in some cases. We use observationally-motivated inputs to construct a model matched to typical local star-forming galaxies, and quantify the biases in strong-line ratios, electron temperatures, and direct-method metallicities as inferred from global galaxy spectra relative to the median values of the HII region distributions in each galaxy. We also provide a generalized set of models that can be applied to individual galaxies or galaxy samples in atypical regions of parameter space. We use these models to correct for the effects of flux-weighting and DIG contamination in the local direct-method mass-metallicity and fundamental metallicity relations, and in the mass-metallicity relation based on strong-line metallicities. Future photoionization models of galaxy line emission need to include DIG emission and represent galaxies as ensembles of emitting regions with varying metallicity, instead of as single HII regions with effective properties, in order to obtain unbiased estimates of key underlying physical properties.
R. Sanders, A. Shapley, K. Zhang, et. al.
Thu, 17 Aug 17
42/50
Comments: 35 pages, 27 figures, 4 tables. Submitted to ApJ. See Figures 15-17 for typical global galaxy biases in strong-line ratios, electron temperatures, and direct-method metallicities